SCIENCE CHINA Information Sciences, Volume 60, Issue 7: 072401(2017) https://doi.org/10.1007/s11432-016-0346-1

## Comparison of single-event upset generated by heavy ion and pulsed laser

• AcceptedNov 23, 2016
• PublishedJun 13, 2017
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### Abstract

Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.

### Acknowledgment

This work was supported by National Natural Science Foundation of China (Grant Nos. 61376109, 61434007). The authors would like to thank the HI-13 teams, the HIRFL teams and the SEEL teams for heavy ion and pulsed laser experiment supports.

• Figure 1

The schematics of (a) the conventional D flip-flop and (b) the conventional DICE flip-flop.

• Figure 2

The schematics of (a) the test circuit and (b) the whole layout.

• Figure 3

The structure of the heavy ion experiment setup.

• Figure 4

The measured SEU cross sections with (a) solid 0 and (b) solid 1 dynamic test mode in Test-A.

• Figure 5

The measured SEU cross sections with (a) solid 0 and (b) solid 1 dynamic test mode in Test-B.

• Figure 6

The TCAD models of the D and DICE flip-flops.

• Figure 7

The simulated SEU percentage of the D and DICE flip-flops with different beam spot sizes. (a) The incident equivalent LET is 20 ${\rm MeV\cdot cm^2/mg}$; (b) the incident equivalent LET is 100 ${\rm MeV\cdot cm^2/mg}$.

• Figure 8

The simulated SEU percentage of the D and DICE flip-flops with the variation of the equivalent LET. (a) The incident equivalent LET is 20 ${\rm MeV\cdot cm^2/mg}$; (b) the incident equivalent LET is 100 ${\rm MeV\cdot cm^2/mg}$.

• Figure 9

The simulated collected charge with different beam spot sizes.

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