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SCIENCE CHINA Information Sciences, Volume 60, Issue 12: 129402(2017) https://doi.org/10.1007/s11432-016-9001-9

Modeling the impact of process and operation variations on the soft error rate of digital circuits

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  • ReceivedNov 21, 2016
  • AcceptedJan 3, 2017
  • PublishedFeb 24, 2017

Abstract

There is no abstract available for this article.


Acknowledgment

This work was supported by National Natural Science Foundation of China (Grant Nos. 61376109, 61434007). The authors would like to thank the HI-13 team and the HIRFL team for heavy ion experiment support.


References

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