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SCIENCE CHINA Information Sciences, Volume 61, Issue 6: 069403(2018) https://doi.org/10.1007/s11432-017-9360-7

Defect characterization of amorphous silicon thin film solar cell based on low frequency noise

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  • ReceivedOct 13, 2017
  • AcceptedJan 23, 2018
  • PublishedApr 11, 2018

Abstract

There is no abstract available for this article.


Acknowledgment

This work was supported by National Natural Science Foundation of China (Grant No. 61106062), Fundamental Research Funds for the Central Universities (Grant No. JB181409), and Ankang College Youth Fund (Grant No. 2017AYQN06).


References

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