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SCIENCE CHINA Information Sciences, Volume 62, Issue 12: 226401(2019) https://doi.org/10.1007/s11432-019-2643-5

Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities

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  • ReceivedAug 19, 2019
  • AcceptedSep 4, 2019
  • PublishedOct 22, 2019

Abstract

There is no abstract available for this article.


Acknowledgment

This work was supported by National Natural Science Foundation of China (Grant No. 61604095) and Shanghai Natural Science Fund (Grant No. 19ZR1475300).


References

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