中文
Affiliations：
1. School of Computer, Hubei Polytechnic University, Huangshi 435003, China
2. School of Computer and Communication Engineering, ChangSha University of Science and Technology, Changsha 410004, China
* Corresponding author (forry1230@126.com)
There is no abstract available for this article.
国家自然科学基金项目(61303042,61472123)
湖北省自然科学基金项目(2014CFC1091)
湖北省教育厅科研项目(B2014026)
湖北理工学院创新人才项目(13xjz05c)
湖北理工学院优秀青年科技创新团队项目(13xtz10)
湖北理工学院大学生创新项目(13cx25)
representative scan
scan architecture
design for testing
digital integrated circuit testing
low power testing
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